Beam Position Ion Chamber (BPIC)
The Beam position Ion chamber (BPIC) is based on the IC PLUS product range. The device allows you to detemine the change in position in a single axis by comparing two signals that are created as the beam passes through the Ion Chamber. By connecting two Ion chambers together at 90° you can determine the horizontal and vertical beam position.
Beam Position Ion Chamber (BPIC) downloads
Download our Catalogue
The FMB Oxford 2009 Catalogue is now available for download in PDF Format
