Engineering science for a brighter tomorrow

Bent Crystal Laue Analyser

Bent Crystal Laue Analyser

The FMB Oxford BCLA is a versatile, narrow bandpass filter that can enable you to achieve the ultimate performance in a variety of applications, including XRF and XAFS experiments at a synchrotron beamline.
The system, which is compatible with a variety of back-end detectors, rejects undesired x-ray photons (e.g. scattering and fluorescence from other elements in the sample) before they can be detected; drastically improving signal to noise ratio.

The core of the BCLA is a silicon crystal, which is bent into a logarithmic spiral such that X-rays of a selected wavelength are diffracted towards the detector; whilst background radiation is blocked by solar slits. The slit material, crystal shape, and geometry of the BCLA are carefully optimised for a particular working energy range.

Integration simplicity

  • Compatible with numerous detectors: scintillation tubes, ion chambers, and sold state arrays
  • Beam requirements easily achievable from modern synchrotron beamlines and many laboratory sources

Ease of use

  • Rapid alignment using a generic x-y stage

Ultimate performance

  • Very narrow bandpass
  • Large angular acceptance
Input beam size ~100μm in diffracting plane (generally vertical direction)
~1mm in perpendicular direction
Bandpass 10 – 100eV
Input energy ranges 5.3, 6.4, 7.5, 8.4, 9.5, 11.4, 13.6, 16, 1

Ordering Info

Energy Fluorescence lines Part No.
5.3keV Kα: V, Cr, Mn
Lα: Ce, Pr, Nd, Pm, Sm, Eu
6.4keV Kα: Mn, Fe, Co
Lα: Pm, Sm, Eu, Gd, Tb, Dy, Ho
7.5keV Kα: Co, Ni, Cu
Lα: Dy, Ho, Er, Tm, Yb, Lu, Hf, Ta, W
8.4keV Kα: Cu, Zn, Ga
Lα: Ta, W, Re, Os, Ir, Pt
9.5keV Kα: Zn, Ga, Ge, As
Lα: Os, Ir, Pt, Au, Hg, Tl
11.4keV Kα: As, Se, Br, Kr
Lα: Pb, Bi, Po, At, Rn, Fr, Ra
13.6keV Kα: Kr, Rb, Sr, Y
Lα: Th, Pa, U, Np, Pu, Am
16.0keV Kα: Y, Zr, Nb, Mo
Lα: Am
18.4keV Kα: Nb, Mo, Tc, Ru, Rh
Lα: N/A
22.0keV Kα: Rh, Pd, Ag, Cd, In
Lα: N/A