The IC Spec ionisation chamber has been specially designed for high precision X-ray intensity measurements at Synchrotrons and is particularly suited for transmission X-ray absorption spectroscopy measurements such as EXAFS or XANES. It has a large installed base and has undergone extensive testing on beamlines worldwide; it has been shown, at the European Synchrotron Radiation Facility, that it is capable of measuring EXAFS spectra with signal to noise of the order 10⁵

I101 Fast Current Amplifier

Features

• Transimpedance Gain from 10³ to 10¹¹ V/A
• Input Noise down to 4.3 fA/√Hz
• Bandwidth up to 500 kHz
• Rise Time down to 700 ns
• Adjustable Bias Voltage
• Manual and Remote Control

Features

• Four gated integrator channels
• Dynamic range 1 pA to 1 mA
• Integrated digitisation and filtering
• Fibre-optic, RS-232 and RS-485 interfaces
• Integrated calibration test source
• Selection of current and charge integration modes
• External trigger capability
• Four independent analogue/frequency monitor outputs, configurable to show various analog parameters such as current, position
• Optional high voltage output

Applications

• Quadrant photodiode readout
• Low current and charge measurement
• Beam position monitors

Options

• Auxiliary HV output
• Alternative feedback capacitor options

For full specification detail click on the relevant datasheet